Supports both single and multi-channel V-groove arrays, configurable based on customer requirements.

The V-groove array is mounted on a precision motor-driven arm to provide precise control of the incidence angle.

The setup includes a top and side view visible wavelength cameras for precise positioning of the V-groove or fiber onto the device on the photonic circuits.

A bottom SWIR camera ensures accurate fiber-to-grating coupler alignment.

Upgrade to a fully automated system for hands-free, overnight measurements.

With just a few calibration steps, the translational stage will systematically test every device marked in the software, collecting and saving data autonomously.

While this feature increases the system cost, it significantly boosts efficiency and maximizes throughput, making it ideal for high-volume testing environments.

Designed for seamless operation, the dual-monitor interface enhances user interaction.

One monitor provides a live feed from all microscope cameras, often displayed on a touchscreen for an intuitive, all-angle device view.

The second monitor hosts the analysis and measurement GUI, where users can configure different measurement recipes and save them for specific chips.

The GUI integrates with a sample database storing SEM images, measurement types, microscope images, wavelength spectra, and supports data export to Excel and plotting tools for comprehensive analysis.

The probe station allows seamless integration of both high-speed RF probes and DC probes.

Custom probe adaptors can be designed to accommodate user-specified RF probes.

The system includes top-of-the-line RF probes capable of measurements exceeding 110 GHz, ensuring precision and reliability for advanced photonic applications.

The system can measure photonic chips of various sizes, from small 10mm samples up to full-inch wafers.

On special request, the setup can be scaled to accommodate larger wafers, including 6-inch and 8-inch wafers, offering flexibility for different research and industrial applications.